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JEOL - JSM-5600 Scanning Electron Microscope (SEM) - 1998
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Lot specifications
- Quantity
- 1
- Margin
- No
- Brand
- JEOL
- Weight
- 1kg
- Type
- JSM-5600
- Year of build
- 1998
- Electric connection
- 230V
- Total dimension L
- 2100mm
- Total dimension W
- 1100mm
- Total dimension Height
- 1900mm
- HS Code
- 9012.10
- Terms of delivery
- Ex foundation-unpackaged
Description
Scanning Electron Microscope (SEM) JEOL JSM-5600 made in Japan. Laboratory equipment for surface analysis and material characterization. Equipped with Oxford Instruments EDS detector model 6587 (ATW2), declared resolution of 138 eV at 5.9 keV, elemental X-ray analysis system, tilting sample chamber and vacuum system. It includes an electronic column, anti-vibration table, EDS Oxford Instruments detector and components visible in the photographs. Visually complete condition. It is advisable to verify the operation of the vacuum system, electronic cannon, control electronics and software before marketing.
Additional details
All items are sold as used and unchecked.
For more detailed information, please refer to the auction terms and conditions.
Contact for technical inquiries and appointment request for visits:
Elisabeth De Prada
Email: elisabeth.deprada@surplex.com
